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Lisa Zurk

APL-UW Executive Director

Professor, Electrical Engineering

Email

zurkl@apl.washington.edu

Phone

206-543-1310

Biosketch

Dr. Zurk joined the Laboratory in the spring of 2018 to become the eighth APL-UW leader since its founding in 1943. She has been associated with the Laboratory throughout her career. She pursued research with APL-UW mentors while a graduate student in the UW Department of Electrical Engineering, where her dissertation was on electromagnetic wave propagation in remote sensing of snow, then was an APL-UW associate scientist during her tenure at Portland State University.

Dr. Zurk concurrently joined the UW Department of Electrical Engineering as a full professor, enriching the interdisciplinary efforts of UW EE and APL-UW.

Her many accolades and distinctions include receiving a Fulbright scholarship, the National Science Foundation CAREER Award, the Presidential Early Career Award for Scientists and Engineers (PECASE), the Office of Naval Research Faculty Award, and fellow status in the Acoustical Society of America.

Department Affiliation

Director's Office

Education

B.S. Computer Science, University of Massachusetts, Amherst, 1985

M.S. Electrical and Computer Engineering, Northeastern University, 1991

Ph.D. Electrical Engineering, University of Washington, 1995

Publications

2000-present and while at APL-UW

Teraherz imaging of thin film layers with matched field processing

Schecklman, S., and L.M. Zurk, "Teraherz imaging of thin film layers with matched field processing," Sensors, 18, 3547, doi:10.3390/s18103547, 2018.

More Info

19 Oct 2018

Terahertz (THz) time of flight (TOF) tomography systems offer a new measurement modality for non-destructive evaluation (NDE) of the subsurface layers of protective coatings and/or laminated composite materials for industrial, security and biomedical applications. However, for thin film samples, the time-of-flight within a layer is less than the duration of the THz pulse and consequently there is insufficient range resolution for NDE of the sample under test. In this paper, matched field processing (MFP) techniques are applied to thickness estimation in THz TOF tomography applications, and these methods are demonstrated by using measured THz spectra to estimate the the thicknesses of a thin air gap and its depth below the surface. MFP methods have been developed over several decades in the underwater acoustics community for model-based inversion of geo-acoustic parameters. It is expected that this research will provide an important link for THz researchers to access and apply the robust methods available in the MFP literature.

Measurement and application of incoherent terahertz scattering using time-domain spectroscopy

Arbab, M.H., D.P. Winebrenner, A. Chen, D. Wang, E.I. Thorsos, and L.M. Zurk, "Measurement and application of incoherent terahertz scattering using time-domain spectroscopy," Proceedings, 33rd International Conference on Infrared and Millimeter Waves and 16th International Conference on Terahertz Electronics, 15-29 September, Pasadena, CA (IEEE, 2008).

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15 Sep 2008

Measurement of incoherent rough surface scattering powers in terahertz frequency regime by means of time-domain spectroscopy has been for the first time demonstrated. Furthermore, applications of such incoherent measurements in spectroscopy and detection of chemicals are presented.

Acoustics Air-Sea Interaction & Remote Sensing Center for Environmental & Information Systems Center for Industrial & Medical Ultrasound Electronic & Photonic Systems Ocean Engineering Ocean Physics Polar Science Center
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